April 19, 2024 1:15 PM
PAIS-2540, PAIS

Presenter: Sujeet Pani

Abstract:
Quantum metrology aims to determine the limits in precision for measuring a parameter of a physical system, and the measurements allowing for achieving these quantum limits. In this talk, I will discuss my current work focusing on quantum measurements for two metrological problems: imaging and phase sensing. The first effort investigates optimal measurements for super-resolution of incoherent point sources for applications in fluorescence microscopy. The second effort investigates measurements for efficient optical phase estimation with single photons. These two efforts make use of the tools in quantum metrology to devise (near) quantum-optimal measurements for a given metrological task.