Southwest Quantum Information and Technology

Exploring electric-field noise mechanisms through treatments of an ion trap surface

Presenting Author: Maya Berlin-Udi, University of California Berkeley
Contributing Author(s): Clemens Matthiesen, Alberto Alonso, Crystal Noel, Peter T. Lloyd, Vincenzo Lordi, Hartmut Häffner

Electric-field noise is a major limiting factor in the performance and scalability of ion traps. Despite intensive research over the past decade, the microscopic mechanism underlying electric-field noise near surfaces is unknown. We use a single trapped ion as a detector to measure noise at megahertz frequencies, and we find that our measurements are consistent with noise produced by an ensemble of thermally activated fluctuators. We alter the surface with treatments such as prolonged heating and argon ion bombardment, and monitor changes in surface composition and electric field noise in response to these treatments. With these experiments, we establish a concrete link between electric-field noise characteristics and microscopic properties of the ion trap surface.

(Session 8 : Sunday from 2:45pm - 3:15pm)