Abstracts
Poster Abstracts | Talk Abstracts
Quantum process tomography of linear optical devices
Presenting Author: Pratik Barge, Louisiana State University
Contributing Author(s): Kevin Jacob, Jonathan Dowling
Quantum process tomography is an indispensable tool for quantum information processing. In the realm of quantum optics, the task is to characterize the evolution of the mode creation and annihilation operators. Several methods to characterize a multi-mode passive linear optical unitary have been developed, but the precision of these methods is bound by the shot-noise limit. In our work, we propose a method to go beyond the shot-noise limit by using tools from quantum metrology. We demonstrate this by using non-classical states of light and by employing Gaussian and non-Gaussian measurement strategies.
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