Abstracts

Generalized Multimode Single Photon Metrology

Presenting Author: Jonathan Olson, Louisiana State University
Contributing Author(s): Keith R. Motes, Nick M. Studer, Margarite LaBorde, Todd Mulder, Peter P. Rohde, and Jonathan P. Dowling

It has been shown that quantum metrology using only single photons, passive optical elements, and simple single-mode disjoint photodetection, is capable of beating the shotnoise limit. Here, we give a more complete description of the phase sensitivity of such devices, optimizing over all phase strategies and unitaries. We show that even better sensitivity can be achieved with a much simpler architecture -- one that is already very close to being implemented experimentally, and that could be made scalable on a short time scale.

(Session 5 : Thursday from 5:00 - 7:00 pm)

 

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